Return to Fabrication Wiki
Keywords: test; testing
-
Managing multiple inputs and outputs (Physical Computing 381-414)
-
Setting groups of pins in parallel (Physical Computing 381-385)
-
Bitwise operations (Physical Computing 385-388)
-
Resistor ladders for analog input (Physical Computing 388-389)
-
Row-column scanning (Physical Computing 389-397)
-
Shift registers (Physical Computing 397-404)
-
8-bit Shift Register report from NYU ITP
-
Multiplexers (Physical Computing 404-409)
-
Latches (Physical Computing 409-413)
-
Testbed + Pogopins = Pogobed from SparkFun
-
Low level bit hacks for embedded system programming

